In Situ Atomic Force Microscope Imaging of Supported Lipid Bilayers

2001 ◽  
Vol 2 (2) ◽  
pp. 105-108 ◽  
Author(s):  
Thomas Kaasgaard ◽  
Chad Leidy ◽  
John Hjort Ipsen ◽  
Ole G. Mouritsen ◽  
Kent Jørgensen
Keyword(s):  
Atomic Force Microscope ◽  
Lipid Bilayers ◽  
Supported Lipid Bilayers ◽  
Atomic Force ◽  
Microscope Imaging

scholarly journals Pulling lipid tubes from supported bilayers unveils the underlying substrate contribution to the membrane mechanics

Nanoscale ◽  
2018 ◽  
Vol 10 (30) ◽  
pp. 14763-14770 ◽  
Author(s):  
Berta Gumí-Audenis ◽  
Luca Costa ◽  
Lidia Ferrer-Tasies ◽  
Imma Ratera ◽  
Nora Ventosa ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Lipid Bilayers ◽  
Supported Lipid Bilayers ◽  
Membrane Mechanics ◽  
Supported Bilayers ◽  
Atomic Force ◽  
Underlying Substrate

Pulling lipid tubes with an atomic force microscope from supported lipid bilayers explores the substrate contribution to the membrane nanomechanics.

scholarly journals Using the Atomic Force Microscope to Study the Interaction between Two Solid Supported Lipid Bilayers and the Influence of Synapsin I

2004 ◽  
Vol 87 (4) ◽  
pp. 2446-2455 ◽  
Author(s):  
Ioana Pera ◽  
Rüdiger Stark ◽  
Michael Kappl ◽  
Hans-Jürgen Butt ◽  
Fabio Benfenati
Keyword(s):  
Atomic Force Microscope ◽  
Lipid Bilayers ◽  
Supported Lipid Bilayers ◽  
Synapsin I ◽  
Atomic Force

Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

scholarly journals In situ observation of streptavidin-biotin binding on an immunoassay well surface using an atomic force microscope

FEBS Letters ◽  
1996 ◽  
Vol 390 (2) ◽  
pp. 161-164 ◽  
Author(s):  
S. Allen ◽  
J. Davies ◽  
A.C. Dawkes ◽  
M.C. Davies ◽  
J.C. Edwards ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
In Situ Observation ◽  
Atomic Force ◽  
Biotin Binding
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